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Effectuality of Barrier Height Inhomogeneity on the Current-Voltage-Temperature Characteristics of Metal Semiconductor Structures with CdZnO Interlayer

Taşçıoğlu, İlke; Tan, Serhat Orkun; Yakuphanoğlu, Fahrettin; Altındal, Şemsettin (Springer, 2018-10)

Current-conduction/transport mechanisms (CCMs or CTMs) through barrier and barrier height (BH) formation in the Al/(CdZnO)/p-Si/Al diodes, which were prepared by the sol-gel method, were examined in the range of 110-380 ...