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dc.contributor.authorAblikim, M.
dc.contributor.authorAchasov, M. N.
dc.contributor.authorAdlarson, P.
dc.contributor.authorAhmed, S.
dc.contributor.authorAlbrecht, M.
dc.contributor.authorKolcu, O. B.
dc.date.accessioned2022-11-22T07:15:29Z
dc.date.available2022-11-22T07:15:29Z
dc.date.issued2022en_US
dc.identifier.citationLi, Q., Zhou, J. Y., Liu, Z. H., Xu, J. S., Li, C. F., & Guo, G. C. (2019). Stable single photon sources in the near C-band range above 400 K. Journal of Semiconductors, 40(7), 072902.en_US
dc.identifier.issn1674-1137
dc.identifier.issn2058-6132
dc.identifier.urihttps://doi.org/10.1088/1674-1137/ac80b4
dc.identifier.urihttps://hdl.handle.net/20.500.12294/3052
dc.description.abstractThe integrated luminosities of data samples collected in the BESIII experiment in 2016-2017 at center-of-mass energies between 4.19 and 4.28 GeV are measured with a precision better than 1% by analyzing large-angle Bhabha scattering events. The integrated luminosities of old datasets collected in 2010-2014 are updated by considering corrections related to detector performance, offsetting the effect of newly discovered readout errors in the electromagnetic calorimeter, which can haphazardly occur.en_US
dc.language.isoengen_US
dc.publisherIOP Publishing Ltden_US
dc.relation.ispartofChinese Physics Cen_US
dc.identifier.doi10.1088/1674-1137/ac80b4en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectIntegrated Luminosityen_US
dc.subject$ e<^>+e<^>- $ Annihilationen_US
dc.subjectBhabha Scatteringen_US
dc.titleMeasurement of integrated luminosities at BESIII for data samples at center-of-mass energies between 4.0 and 4.6 GeV*en_US
dc.typearticleen_US
dc.departmentMühendislik ve Mimarlık Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.authorid0000-0002-9177-1286en_US
dc.identifier.volume46en_US
dc.identifier.issue11en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.institutionauthorKolcu, Onur Buğra
dc.authorwosidP-4990-2015en_US
dc.identifier.wosqualityQ2en_US
dc.identifier.wosWOS:000876708200001en_US


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